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Proceedings Paper

EUV polarimetry with single multilayer optical element
Author(s): Sara Zuccon; Maria-Guglielmina Pelizzo; P. Nicolosi; A. Giglia; N. Mahne; S. Nannarone
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Paper Abstract

A polarimetric measurement technique based on the analysis of the reflection data given by a single mirror rotated around the incidence beam axis is presented. In the extreme ultraviolet spectral region, a multilayer coated mirror must be used. The multilayer mirror must be fully characterized before the experiment. Theory demonstrates how this method allows complete determination of Stoke's parameters in case of a totally polarized beam. A simulation code has been developed in order to model the experiment in case of synchrotron radiation propagating in a bending magnet beamline and impinging a multilayer mirror. The simulation is useful to verify each time the effectiveness of the method in the different experimental conditions considered. Finally an experimental application is presented.

Paper Details

Date Published: 3 September 2008
PDF: 13 pages
Proc. SPIE 7077, Advances in X-Ray/EUV Optics and Components III, 70771R (3 September 2008); doi: 10.1117/12.791907
Show Author Affiliations
Sara Zuccon, INFM-LUXOR, Univ. degli Studi di Padova (Italy)
Lab. TASC-INFM (Italy)
Maria-Guglielmina Pelizzo, INFM-LUXOR, Univ. degli Studi di Padova (Italy)
P. Nicolosi, INFM-LUXOR, Univ. degli Studi di Padova (Italy)
A. Giglia, Lab. TASC-INFM (Italy)
Univ. degli Studi di Modena e Reggio Emilia (Italy)
N. Mahne, Lab. TASC-INFM (Italy)
S. Nannarone, Lab. TASC-INFM (Italy)
Univ. degli Studi di Modena e Reggio Emilia (Italy)


Published in SPIE Proceedings Vol. 7077:
Advances in X-Ray/EUV Optics and Components III
Ali M. Khounsary; Christian Morawe; Shunji Goto, Editor(s)

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