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Proceedings Paper

A new phase unwrapping algorithm using two digital phase-shifting gratings of different period for fringe projective 3D profile sensor
Author(s): Jian Luo; Yi Wang; Ai Xiong; Jiahu Yuan
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Paper Abstract

Fringe projective 3D profile sensor can obtain dense coordinates map of object outline fast and quantitatively. Phase unwrapping technique plays an important role in the performance of the sensor when phase-shifting fringe patterns are used. The multi-period phase shift method can considerably increase the accuracy of measuring phase value. However, due to error of intensity approximation arisen from digital grating and the spatial resolution limits on the projector and cameras of the senor, the result of unwrapped phase value is still within noise only by means of temporal phase-unwrapping. A new algorithm combining the spatial and temporal phase-unwrapping methods is presented. The algorithm, which is a good compromise between the number of needed gratings and the unwrapping reliability, is especially designed for using two groups of digital phase-shifting gratings with different period. Experiments have been carried out by selecting about thirty pairs of periods to illustrate the efficiency of temporal and spatial criterions, and the results offer the tolerance of phase calculation which is unwrapped correctly. The algorithm has been implemented on a test system, and the ratio of unwrapping successfully reaches to 80% with the repeated error 0.05 rad.

Paper Details

Date Published: 5 March 2008
PDF: 14 pages
Proc. SPIE 6623, International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing, 662324 (5 March 2008); doi: 10.1117/12.791551
Show Author Affiliations
Jian Luo, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yi Wang, Institute of Optics and Electronics (China)
Ai Xiong, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Jiahu Yuan, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 6623:
International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing

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