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Proceedings Paper

Image edge-enhancement using orthogonally polarized light
Author(s): Yunying Zhang; Zhongxiu Hao; Lijing Wei; Panlai Li; Sufang Huai; Qingling Guo
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Paper Abstract

The diffraction efficiency of the volume grating written and read out in Ce:KNSBN crystal by using orthogonally polarized light beams (solid state laser with 532nm) is experimentally studied, which exhibits a loop versus the variation of the fringe modulation. And compare with the extraordinary polarization, the diffraction efficiency is improved 20% with mutually orthogonal polarized wave while the angle between the incident plane and the polarization direction of the pump beam equals to 30°. The properties of two-wave coupling edge-enhancement under different intensity ratio of the reference beam to the object beam are experimentally investigated by using the setup of the Fourier-transform hologram real-time writing and reading with Ce:KNSBN crystal as the recording medium. It is found that the effect of the image edge-enhancement strongly influenced by the intensity ratio of the reference beam to the object beam. There is no edge-enhancement with the intensity ratio of the reference beam to the object beam of 50:1, the high frequency component in the object beam is enhanced greatly and the low frequency component is obviously weakened with the intensity ratio of the reference beam to the object beam of 3:1. Along with the decreasing of the intensity ratio of the reference beam to the object beam, the effect of the image edge-enhancement is still obvious even when the intensity ratio reverses.

Paper Details

Date Published: 5 March 2008
PDF: 6 pages
Proc. SPIE 6623, International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing, 66230M (5 March 2008); doi: 10.1117/12.791407
Show Author Affiliations
Yunying Zhang, Hebei Univ. (China)
Zhongxiu Hao, Hebei Univ. (China)
Lijing Wei, North China Electric Power Univ. (China)
Panlai Li, Hebei Univ. (China)
Sufang Huai, Hebei Univ. (China)
Qingling Guo, Hebei Univ. (China)


Published in SPIE Proceedings Vol. 6623:
International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing

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