Share Email Print
cover

Proceedings Paper

Methods for rectifying projection-interferogram sequences of the computed-tomography imaging interferometer
Author(s): Shufang He; Ningfang Liao; Xinquan Wang; Yu Lin; Qingmei Huang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Computed-Tomography Imaging Interferometer (CTII) is a novel imaging spectrometer, which combines the advantages of the conventional Fourier Transform Imaging Spectrometer (FTIS) and the ordinary Computed-Tomography Imaging Spectrometer (CTIS). CTII obtains multi-angle projection interferograms by rotating Dove prism placed in the collimating light beams. The image reconstruction is carried out by using computed-tomography reconstruction algorithm named Radon transform. However, in experiments, images reconstructed from the raw projection-interferogram sequences, are badly distorted. To solve this problem, we find when Dove prism is rotated, its rotation center is not coincident to the optic axis of CTII. Therefore, the raw projection-interferogram sequences have a few deviations to the ideal sequences. And then we find the deviations follow certain law, so it is possible to rectify the raw projection-interferogram sequences. In this paper, two methods, the Linear rectification method and the Cosine rectification method are proposed. The Linear rectification method uses an image processing method, gets the dither value at each rotation angle, and rectifies the raw images. The Cosine rectification method supposes the dither follows cosine change; the detail is presented in this paper. Finally, the reconstruction images are presented. The reconstruction results show these two rectification methods are feasible and effective.

Paper Details

Date Published: 5 March 2008
PDF: 8 pages
Proc. SPIE 6623, International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing, 66230C (5 March 2008); doi: 10.1117/12.791276
Show Author Affiliations
Shufang He, Beijing Institute of Technology (China)
Ningfang Liao, Beijing Institute of Technology (China)
Xinquan Wang, Beijing Institute of Technology (China)
Yu Lin, Beijing Institute of Technology (China)
Qingmei Huang, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 6623:
International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing

© SPIE. Terms of Use
Back to Top