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Proceedings Paper

Research on non-destructive testing method of silkworm cocoons based on image processing technology
Author(s): Yong Gan; Qing-hua Kong; Li-fu Wei
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Paper Abstract

The major studied in this dissertation is the non-destructive testing method of silkworm cocoon's quality, based on the digital image processing and photoelectricity technology. Through the images collection and the data analysis, procession and calculation of the tested silkworm cocoons with the non-destructive testing technology, internet applications automatically reckon all items of the classification indexes. Finally we can conclude the classification result and the purchase price of the silkworm cocoons. According to the domestic classification standard of the silkworm cocoons, the author investigates various testing methods of silkworm cocoons which are used or have been explored at present, and devices a non-destructive testing scheme of the silkworm cocoons based on the digital image processing and photoelectricity technology. They are dissertated about the project design of the experiment. The precisions of all the implements are demonstrated. I establish Manifold mathematic models, compare them with each other and analyze the precision with technology of databank to get the best mathematic model to figure out the weight of the dried silkworm cocoon shells. The classification methods of all the complementary items are designed well and truly. The testing method has less error and reaches an advanced level of the present domestic non-destructive testing technology of the silkworm cocoons.

Paper Details

Date Published: 19 February 2008
PDF: 8 pages
Proc. SPIE 6625, International Symposium on Photoelectronic Detection and Imaging 2007: Related Technologies and Applications, 66251B (19 February 2008); doi: 10.1117/12.791207
Show Author Affiliations
Yong Gan, Guilin Univ. of Electronic Technology (China)
Tongji Univ. (China)
Qing-hua Kong, Tongji Univ. (China)
Li-fu Wei, Guilin Univ. of Electronic Technology (China)


Published in SPIE Proceedings Vol. 6625:
International Symposium on Photoelectronic Detection and Imaging 2007: Related Technologies and Applications

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