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Proceedings Paper

Study of wavefront error and polarization of a side mounted infrared window
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Paper Abstract

The wavefront error and polarization of a side mounted infrared window made of ZnS are studied. The Infrared windows suffer from temperature gradient and stress during their launch process. Generally, the gradient in temperature changes the refractive index of the material whereas stress produces deformation and birefringence. In this paper, a thermal finite element analysis (FEA) of an IR window is presented. For this purpose, we employed an FEA program Ansys to obtain the time-varying temperature field. The deformation and stress of the window are derived from a structural FEA with the aerodynamic force and the temperature field previously obtained as being the loads. The deformation, temperature field, stress field, ray tracing and Jones Calculus are used to calculate the wavefront error and the change of polarization state.

Paper Details

Date Published: 12 March 2008
PDF: 8 pages
Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66241Y (12 March 2008); doi: 10.1117/12.791193
Show Author Affiliations
Jiaguo Liu, Beijing Institute of Technology (China)
Lin Li, Beijing Institute of Technology (China)
Xinqi Hu, Beijing Institute of Technology (China)
Xin Yu, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 6624:
International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing

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