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Proceedings Paper

An integrated measurement system for LED thermal, optical and electrical characteristics
Author(s): Xiyong Zou; Xiaoming Zheng; Shangzhong Jin; Kai Ni; Huaming Zhou; Xianqi He
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Paper Abstract

Thermal, optical and electrical parameters are main characterization of light-emitting diodes (LEDs). Consumers are often concerned about the explicit properties such as luminous intensity, luminous flux and color. But Manufacturers may pay more attention to the thermal characteristic. Excess heat at the junction directly affects the LED performance in terms of color shit, light output and life. To measure all these parameters of LED accurately and simultaneously, we designed an integrated system, product number SSP8112, which was based on a new developed thermal, optical and electrical measurement instrument and a specially-made integrating sphere with temperature controller. The thermal measurement segment of the instrument was developed in accordance with JESD51-1 standard; it can automatically record the transient response curve of heat with a 50μs time resolution and a 0.5mV voltage resolution. And the integrating sphere, which has high light reflectivity, good thermal insulation and tolerance to high temperature, was used to achieve the optical response during the experiment. The principle and structure of this system were introduced and discussed, and at the end an application example was presented.

Paper Details

Date Published: 12 March 2008
PDF: 9 pages
Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66241Q (12 March 2008); doi: 10.1117/12.791178
Show Author Affiliations
Xiyong Zou, China Jiliang Univ. (China)
Xiaoming Zheng, Starspec Optoelectronic Technology Co., Ltd. (China)
Shangzhong Jin, China Jiliang Univ. (China)
Kai Ni, China Jiliang Univ. (China)
Huaming Zhou, Starspec Optoelectronic Technology Co., Ltd. (China)
Xianqi He, Starspec Optoelectronic Technology Co., Ltd. (China)


Published in SPIE Proceedings Vol. 6624:
International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing
Liwei Zhou, Editor(s)

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