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Proceedings Paper

Application of a high-precision interferometric measuring system as phasing the segmented primary mirrors of the next generation of ground-based telescope
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Paper Abstract

Optical telescope systems with segmented mirrors require precise coalignment of their segments to achieve the desired full near-diffraction-limit performance. The segment vertical misalignment (piston error) between the segments must be reduced to a small fraction of the wavelength (<100nm) of incoming light. We have considered an interferometric piston error measurement system based on a high-aperture Michelson interferometer layout for accomplishing such objectives, The piston error between the segments can be extracted from the interferometric fringes mismatching, The innovation introduced in the optical design of the interferometer is the simultaneous use of monochromatic light and two-wavelength combination white-light source in a direct method for improving the central fringe identification in the white-light interferometric phasing system. We find that this two-wavelength combination technique can greatly increase the visibility difference between the central fringe and its adjacent side fringes, and thus it offers an increased signal resolution. So make the central fringe identification become easier, and enhance the measure precision of the segment phasing error. As a result, it is suitable for high-precision measurement purpose and application in the segment piston error phasing system.

Paper Details

Date Published: 12 March 2008
PDF: 11 pages
Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66241I (12 March 2008); doi: 10.1117/12.791138
Show Author Affiliations
Helun Song, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)
Hao Xian, Institute of Optics and Electronics (China)
Wenhan Jiang, Institute of Optics and Electronics (China)
Changhui Rao, Institute of Optics and Electronics (China)
Jian Huang, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 6624:
International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing

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