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Proceedings Paper

Image based measurement for the center position error of micro-sphere in micro-target
Author(s): Ting Wang; Zurong Qiu; Jinjiang Wang; Bingzhen Wang
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Paper Abstract

Micro-sphere is the key element in ICF (Inertial Confinement Fusion).The relative position between micro-sphere and cylindrical gold hohlraum is required to be critically accurate so that the motivation energy and transition efficiency of the ICF can be significantly improved. Accurate detection of micro-target assembly (especially the center position error) is necessary and indispensable to ascertain the qualities of ignitions. The micro-sphere and cylindrical gold hohlraum have tiny dimensions and are flimsy and easy to deform. To resolve such problems, a non-contact method based on digital image progressing is proposed to detect the center position error of micro-sphere in this paper. Canny operator is employed to detect the gray-level gradient image. After removing the fake edge points, the images are transformed into binary images by a dual-threshold. To increase the operation speed, a region of interest (ROI) containing only parts of the detected target is selected by alternating manual work. A Hough transform is then selectively applied to the chosen sub-area. The equations of the target circles and the lines can be gotten by fitting these edge points. The center position error of micro-sphere can be obtained based on axial and radial position errors of micro-sphere. Experimental results show that the proposed method is independent of binary thresholds and robust to additional noises. The standard deviation of the center position error is about 2μm, and the maximum error (3σ) is less than 6μm.

Paper Details

Date Published: 12 March 2008
PDF: 12 pages
Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66240X (12 March 2008); doi: 10.1117/12.791097
Show Author Affiliations
Ting Wang, Tianjin Univ. (China)
Zurong Qiu, Tianjin Univ. (China)
Jinjiang Wang, Tianjin Univ. (China)
Bingzhen Wang, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 6624:
International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing

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