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Proceedings Paper

Optical measuring system for defects of artillery lumen
Author(s): Wenjuan Zhu; Chunguang Xu; Dingguo Xiao
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Paper Abstract

At present, some method to measure the defects of artillery lumen has less automation and objectivity, and the other is designed complicatedly and has low efficiency. So the optical measuring system for defects of artillery lumen is developed. The system is made up of a cone-shaped lamp-house, a CCD camera and a mechanism to center and support them, and so on. Whereas the imaging system is nonlinear, there exists geometric distortion on the original image of the artillery lumen. So the pixel coordinate transformation and brightness interpolation are introduced to rectify the geometric distortion of the image and the non-distortion image of the whole artillery lumen surface is gotten. Then the methods such as segmenting, distilling, and area calculating are employed to measure the defects on the rectified image. The experiments prove that the system can measure the defects effectively and rapidly. The precision can be advanced more if the error factors are ameliorated and the methods to compensate the errors are adopted. The measuring precision of the defects area can reach 0.5 mm2.

Paper Details

Date Published: 12 March 2008
PDF: 9 pages
Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66240G (12 March 2008); doi: 10.1117/12.791067
Show Author Affiliations
Wenjuan Zhu, Beijing Institute of Technology (China)
Chunguang Xu, Beijing Institute of Technology (China)
Dingguo Xiao, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 6624:
International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing

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