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Proceedings Paper

Testing the large aperture optical components by the sub-aperture stitching interferometer
Author(s): Yong He; Zhao-xuan Wang; Qing Wang; Bo Ji
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Paper Abstract

Nowadays many large aperture optical components are widely used in the high-tech area, how to test them become more and more important. Here describes a new method to test the large aperture optical components using the small aperture interferometer, deduce how to get the aperture number and the concrete process of the stitching parameter in a systematic way, finally get the best plan to choose the sub-aperture of the square and circular optical plane. To specify the stability of the method we operate an experiment, the result shows that the stitching accuracy can reach λ/10, it meet the need of the inertia constraint fusion etc, that is good enough to be used in the high-tech area.

Paper Details

Date Published: 12 March 2008
PDF: 9 pages
Proc. SPIE 6624, International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing, 66240D (12 March 2008); doi: 10.1117/12.791064
Show Author Affiliations
Yong He, Nanjing Univ. of Science & Technology (China)
Zhao-xuan Wang, Nanjing Univ. of Science & Technology (China)
Qing Wang, Nanjing Univ. of Science & Technology (China)
Bo Ji, Nanjing Univ. of Science & Technology (China)


Published in SPIE Proceedings Vol. 6624:
International Symposium on Photoelectronic Detection and Imaging 2007: Optoelectronic System Design, Manufacturing, and Testing

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