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Proceedings Paper

Test and verification of the theory of paraxial lateral aberrations by a two-electrode electrostatic concentric spherical system model
Author(s): Liwei Zhou; Hui Gong
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Paper Abstract

In the present paper, the paraxial lateral aberrations of second and third orders in imaging electron optical systems, in which the aberration coefficients are solved by asymptotic solutions of paraxial equation, have been verified and tested by a two-electrode electrostatic spherical concentric system model. The analytical expressions of asymptotic solutions and paraxial lateral aberrations of second and third orders in the two-electrode electrostatic spherical concentric system model have been obtained. Result completely proves that the method and procedure given by Monastyrski to solve the paraxial equation of electron optics by asymptotic solutions are correct and practicable. The Recknagel-Artimovich formula of paraxial sphero-chromatic aberration of second order which possess a greatest part in whole paraxial lateral aberrations has been deduced and confirmed. The concrete expressions of paraxial lateral aberrations of third order have been firstly obtained. Results of the present paper will have theoretical and practical significance for the design of image tubes.

Paper Details

Date Published: 3 March 2008
PDF: 16 pages
Proc. SPIE 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection, 66212B (3 March 2008); doi: 10.1117/12.790990
Show Author Affiliations
Liwei Zhou, Beijing Institute of Technology (China)
Hui Gong, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 6621:
International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection

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