Share Email Print
cover

Proceedings Paper

Effective method to improve the lens F# of un-cooled IR detector systems
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Infrared thermal imaging systems has developments advance rapidly during the development of the research and the manufacture technical. And its applied field has going deep into the astronautics, industry, agriculture, medical, traffic and other fields from the national defense and military appliance. Especially in the application of the military, it has come into being a specialty IR System Engineering field. But in many important applications, the lens calibre of the IR thermal imaging systems often be made very large to advance the SNR of the systems. This increased the weight and the research cost of the whole system very much. Many research indicated that the main factor to affect the image quality of the IR systems is the fixed pattern noise (FPN) or spatial non-uniformity under the actual technical and manufacture level. If we using the effective dynamic self-adaptive non-uniformity correction algorithms for the IR system, and use the image enhancement technology simultaneity. We can advance the imaging quality greatly. With this plan, the correction image we got with large F number can receive the level that uncorrected image with 1 or 2 smaller F number. It means the lens calibre of the system will be reduced effectively. And the weight, the cubage and the research cost of the system will be reduced greatly. It will have most important value in the applied of the actual engineering.

Paper Details

Date Published: 3 March 2008
PDF: 13 pages
Proc. SPIE 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection, 662128 (3 March 2008); doi: 10.1117/12.790987
Show Author Affiliations
Li-quan Dong, Beijing Institute of Technology (China)
Wei-qi Jin, Beijing Institute of Technology (China)
Jing Sui, Beijing Institute of Technology (China)
Xiao-xiao Zhou, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 6621:
International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection

© SPIE. Terms of Use
Back to Top