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Proceedings Paper

Optimum principles and its modeling of integrated relation for FPA thermal imagers
Author(s): Lvbo Mai; Weiqi Jin
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Paper Abstract

The principles of the integrated relation optimum for FPA thermal imagers in this article are established through studying. The targets of the integrated relation optimum for FPA thermal imagers are determined. The integrated relation optimum problems of thermal imager systems are the optimum problems of multi-layers, multi-modes and multi-objects. It is difficult to build up a math model for optimizing because the optimum objects have the special features of discrete, non-number and fuzzy. This article applies the large-scale system control theory and the principles of generalization, serialization, unitization to research and establish the optimum theories and methods of system integration relations. The important factors related to optimum, its vector relations and vector models are researched and determined. The broad sense optimum model system space of thermal imaging systems is researched out and built up which is consisted of object models, tool models and target models. According to the integrated relation optimum features of FPA thermal imagers, the operating procedure for optimizing system integrated relation and assemble relation is worked out. The optimum system relation with a high-integrated common assemble and special assembles is obtained through using the optimum methods. The optimized common assembles are sensor assembles of generalization. The optimized special assembles are infrared optical system assembles of serialization and cooler assembles of serialization. These programs form the top design program of the optimum development for FPA thermal imagers.

Paper Details

Date Published: 3 March 2008
PDF: 8 pages
Proc. SPIE 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection, 662124 (3 March 2008); doi: 10.1117/12.790983
Show Author Affiliations
Lvbo Mai, Beijing Institute of Technology (China)
Weiqi Jin, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 6621:
International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection

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