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Proceedings Paper

NUC correction of IR FPA and error analysis with FPGA
Author(s): Cheng-liang Ge; Zhi-qiang Liu; Jian-tao Wu; Zheng-dong Li; Zhi-wei Huang; Min Wan; Xiao-yang Hu; Guo-bin Fan; Zheng Liang
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Paper Abstract

Infrared camera with IR FPA (Focal Plane Array) has often been used in the fields of target detection, temperature test, surface detection, and so on. And it is very important to run the Non Uniformity Correction (NUC) correction firstly to solve the non-uniformity of FPA which is the inherent character of IR FPA. The NUC character is the inherent performance of IR FPA which has different response rate among pixels for the same IR radiant. This NUC can decrease sensitivity of IR FPA and reduce the resolution of sensor. There are two kinds of methods to do this correction. One is hardware method which is using the DSP. Another one is software method. Within this device, two-point correction method is used to correct the NUC. The Field Programmable Gate Array (FPGA) is used. The FPGA can do better parallel arithmetic and has more programmability. After the NUC correction, the error analysis of this correction is also made. After the correction, the BPR (Bad Pixel Replacement) can be more than 98%.

Paper Details

Date Published: 3 March 2008
PDF: 6 pages
Proc. SPIE 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection, 66211P (3 March 2008); doi: 10.1117/12.790931
Show Author Affiliations
Cheng-liang Ge, Univ. of Electric and Scientific Technology of China (China)
Institute of Applied Electronics, China Academy of Engineering Physics (China)
Zhi-qiang Liu, Institute of Applied Electronics, China Academy of Engineering Physics (China)
Jian-tao Wu, Institute of Applied Electronics, China Academy of Engineering Physics (China)
Zheng-dong Li, Institute of Applied Electronics, China Academy of Engineering Physics (China)
Zhi-wei Huang, Institute of Applied Electronics, China Academy of Engineering Physics (China)
Min Wan, Institute of Applied Electronics, China Academy of Engineering Physics (China)
Xiao-yang Hu, Institute of Applied Electronics, China Academy of Engineering Physics (China)
Guo-bin Fan, Institute of Applied Electronics, China Academy of Engineering Physics (China)
Zheng Liang, Univ. of Electric and Scientific Technology of China (China)


Published in SPIE Proceedings Vol. 6621:
International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection

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