Share Email Print
cover

Proceedings Paper

Contour extracting with combination particle filtering and EM algorithm
Author(s): Bo Meng; Ming Zhu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The problem of extracting continuous structures from images is a difficult issue in early pattern recognition and image processing. Tracking with contours in a filtering framework requires a dynamical model for prediction. Recently, Particle filter, is widely used because its multiple hypotheses and versatility within framework. However, the good choice of the propagation function is still its main problem. In this paper, an improved particle filter, EM-PF algorithm is proposed which using the EM (Expectation-Maximization) algorithm to learn the dynamical models. The EM algorithm can explicitly learn the parameters of the dynamical models from training sequences. The advantage of using the EM algorithm in particle filter is that it is capable of improve tracking contour by having accurate model parameters. Though the experiment results, we show how our EM-PF can be applied to produces more robust and accurate extracting.

Paper Details

Date Published: 19 February 2008
PDF: 6 pages
Proc. SPIE 6625, International Symposium on Photoelectronic Detection and Imaging 2007: Related Technologies and Applications, 66250R (19 February 2008); doi: 10.1117/12.790850
Show Author Affiliations
Bo Meng, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Ming Zhu, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 6625:
International Symposium on Photoelectronic Detection and Imaging 2007: Related Technologies and Applications

© SPIE. Terms of Use
Back to Top