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Proceedings Paper

Characteristic of HgCdTe photoconductive detector in energy distribution measurement system of laser spot in far field
Author(s): Jianmin Zhang; Guobin Feng; Jun Zhao
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Paper Abstract

Detector is an important device for the far-field laser spot measuring apparatus in form of photoelectrical detector array, for it acts as an optical-to-electrical converter in measure. Two working parameters of n-type HgCdTe photoconductor are discussed in this paper. The fundamental electrical properties of n-type Hg1-xCdxTe material are summarized and related to device performance parameters. It can be found that the dark resistance Rd and the voltage responsivity Rv are closely bound up with temperature T and the alloy composition x, and the normalized calculating Rd-T and Rv-T characteristic curves are in good agreement with experimental results at temperature below 20°C. And then the dynamic responses of a detector under laser irradiation are studied by utilizing 2-D transient heat transfer model and empirical formulas. Furthermore, experimental investigation on laser damage in PC-type HgCdTe devices is operated by a means named 1on1. Detectable change in performance parameters has not been found under the irradiation of in-band laser, at power density beyond the detector linear response zone, and time of 200s. When the power of irradiation strengthened, the dark resistance increased, and the responsivity reduced. By observing the surface morphology of HgCdTe wafers, calculating the compositions x from Rd-T characteristic, the causes for performance changing has been analyzed.

Paper Details

Date Published: 3 March 2008
PDF: 8 pages
Proc. SPIE 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection, 66211I (3 March 2008); doi: 10.1117/12.790848
Show Author Affiliations
Jianmin Zhang, Northwest Institute of Nuclear Technology (China)
Guobin Feng, Northwest Institute of Nuclear Technology (China)
Jun Zhao, Northwest Institute of Nuclear Technology (China)

Published in SPIE Proceedings Vol. 6621:
International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection
Liwei Zhou, Editor(s)

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