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Proceedings Paper

A new scene-based nonuniformity corrrection applied in boundary backward recursive reconstruction for arbitrary subpixel microscan
Author(s): Yi-nan Chen; Wei-qi Jin; Lei Zhao; Lin Zhao; Tan Wang
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Paper Abstract

A scene-based nonuiformity correction occurred in the operation of recursive reconstruction for high resolution extracted from subpixel microscan imaging (SMI) sequence are presented and analyzed. The reconstruction algorithm in terms of block-by-block method recursive from the prescient boundary to centre in uniform 2×2 SMI, is updated to the two-dimensional focus plane array (FPA) considering the arbitrary scan translation not equivalent to the accurate halfpixel. In this paper, the focus is concentrated to the nonuniform SMI model with fixed pattern noise (FPN), which corrupts the image by the gain and offset from the individual cell-detector. Then, we firstly demonstrate that once our backward recursive reconstruction implements to the undersampled sequence with FPN, the dramatic impact to the majority pixels is the elimination of the offset due to the quits efficiency by inverse iterative function in each 2×2 region belonging to the high resolution lattice. The final achievement is the nonuiformity correction (NUC) synchronously concomitant with the higher resolution, so our method fully takes account of the potential information of the scanned inter-frames. Application of proposed algorithm to the simulated SMI procedure has the obvious superiority, including the much better image quality indexes from the cleaned FPN, time-consumed saving within one scan period (4 frames), no requirements of statistical assumption so as to the avoidance of ghost artifact, and the inter-frames adaptive property.

Paper Details

Date Published: 3 March 2008
PDF: 12 pages
Proc. SPIE 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection, 66210Z (3 March 2008); doi: 10.1117/12.790749
Show Author Affiliations
Yi-nan Chen, Beijing Institute of Technology (China)
Wei-qi Jin, Beijing Institute of Technology (China)
Lei Zhao, Beijing Institute of Technology (China)
Lin Zhao, Beijing Institute of Technology (China)
Tan Wang, Beijing Institute of Technology (China)
Stevens Institute of Technology (United States)


Published in SPIE Proceedings Vol. 6621:
International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection

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