Share Email Print
cover

Proceedings Paper

Numerical simulation of polarized bidirectional reflectance distribution function (BRDF) based on micro-facet model
Author(s): Weiwei Feng; Qingnong Wei; Shimei Wang; Shisheng Liu; Dexia Wu; Zengdong Liu; Dongfang Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The polarized light scattered by the surface of a material contains information that can be used to describe the properties of the surface. Polarized Bidirectional Reflectance Distribution Function (BRDF) is one of the most important factors used to represent the property of the surface. It uses a 4×4 matrix (Mueller matrix) to describe the properties of the light scattered from the surface. A polarized BRDF model based on the micro-facet theory is used in the numerical simulation. The optical constant parameters contained in the model is derived from the experimental data through genetic algorithm. Comparison between the model calculation and the experimental data shows that this model agrees well with the experimental data, and can be used in the future work.

Paper Details

Date Published: 22 February 2008
PDF: 8 pages
Proc. SPIE 6622, International Symposium on Photoelectronic Detection and Imaging 2007: Laser, Ultraviolet, and Terahertz Technology, 66220A (22 February 2008); doi: 10.1117/12.790729
Show Author Affiliations
Weiwei Feng, Anhui Institute of Optics and Fine Mechanics (China)
Qingnong Wei, Anhui Institute of Optics and Fine Mechanics (China)
Shimei Wang, Anhui Institute of Optics and Fine Mechanics (China)
Shisheng Liu, Anhui Institute of Optics and Fine Mechanics (China)
Dexia Wu, Anhui Institute of Optics and Fine Mechanics (China)
Zengdong Liu, Anhui Institute of Optics and Fine Mechanics (China)
Dongfang Wang, Anhui Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 6622:
International Symposium on Photoelectronic Detection and Imaging 2007: Laser, Ultraviolet, and Terahertz Technology

© SPIE. Terms of Use
Back to Top