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Proceedings Paper

Performance measurement of phosphor screens used in optoelectronic image devices
Author(s): YunSheng Qian; YaFeng Qiu; Hui Li; BenKang Chang
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Paper Abstract

To obtain high quality optoelectronic image devices, the phosphor screens should be evaluated before assembled in the devices. The principle and method of measurement are expounded. A measurement system is developed, which can measure luminous efficiency, luminance, non-uniformity of luminance and persistence of phosphor screen. It can also detect the flaws of screen. The system consists of vacuum chamber, electron gun, electrostatic lens system, high voltage supply, imaging luminance meter, luminous flux tester, control units, signal processing circuit, A/D converter, D/A converter, communication unit, industrial computer and measurement software.

Paper Details

Date Published: 3 March 2008
PDF: 7 pages
Proc. SPIE 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection, 66210G (3 March 2008); doi: 10.1117/12.790601
Show Author Affiliations
YunSheng Qian, Nanjing Univ. of Science & Technology (China)
YaFeng Qiu, Nanjing Univ. of Science & Technology (China)
Hui Li, Nanjing Univ. of Science & Technology (China)
BenKang Chang, Nanjing Univ. of Science & Technology (China)


Published in SPIE Proceedings Vol. 6621:
International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection

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