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Proceedings Paper

Technological improvements on the image quality in the low-intensity x-ray real-time imaging system
Author(s): Ye Li; Guozheng Wang; Zhenlu Sun; Kui Wu; Li Chen; Xin Wang; Qingduo Duanmu; Jingquan Tian
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Paper Abstract

In this paper, the noise and optical aberration which were two controllable factors that affect the image quality in the single-proximity-focusing x-ray image-intensifier were studied. By decreasing the electron gain of microchannel plate (MCP), the noise of the x-ray image-intensifier can be decreased. The optimal operating condition for the image intensifier and the CCD were also investigated. Based on this investigation, the flash-noise of the x-ray image-intensifier can be decreased and the brightness of the image can be improved. At the end of the paper, some results on the image-capturing of the cool CCD with low noise were presented.

Paper Details

Date Published: 3 March 2008
PDF: 7 pages
Proc. SPIE 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection, 66210F (3 March 2008); doi: 10.1117/12.790598
Show Author Affiliations
Ye Li, Changchun Univ. of Science and Technology (China)
Guozheng Wang, Changchun Univ. of Science and Technology (China)
Zhenlu Sun, Institute of Laser Technology (China)
Kui Wu, Changchun Univ. of Science and Technology (China)
Li Chen, Changchun Univ. (China)
Xin Wang, Changchun Univ. of Science and Technology (China)
Qingduo Duanmu, Changchun Univ. of Science and Technology (China)
Jingquan Tian, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6621:
International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection

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