Share Email Print
cover

Proceedings Paper

Characterization of NbSi films for TES bolometers
Author(s): Y. Atik; F. Pajot; C. Evesque; B. Leriche; B. Bélier; L. Dumoulin; L. Bergé; M. Piat; E. Bréelle; D. Prêle; F. Voisin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Future space experiments will require large arrays of sensitive detectors in the submillimeter and millimeter range. Superconducting transition-edge sensors (TESs) are currently under heavy development to be used as ultra sensitive bolometers. In addition to good performance, the choice of material depends on long term stability (both physical and chemical) along with a good reproducibility and uniformity in fabrication. For this purpose we are investigating the properties of co-evaporated NbSi thin films. NbSi is a well-known alloy for use in resistive thermometers. We present a full low temperature characterization of superconductive NbSi films. In order to tune the critical temperature of the NbSi thermometers down to the desired range, we have to adjust the concentration of niobium in the NbSi alloy. Tests are made using 4He-cooled cryostats, 300mK 3He mini-fridges, Resistance Bridges and commercial SQUID. Measured parameters are the critical temperature, the sharpness of the transition. Noise measurements are on-going.

Paper Details

Date Published: 18 July 2008
PDF: 8 pages
Proc. SPIE 7020, Millimeter and Submillimeter Detectors and Instrumentation for Astronomy IV, 70202A (18 July 2008); doi: 10.1117/12.790332
Show Author Affiliations
Y. Atik, CNRS, IAS, Univ. Paris Sud-11 (France)
F. Pajot, CNRS, IAS, Univ. Paris Sud-11 (France)
C. Evesque, CNRS, IAS, Univ. Paris Sud-11 (France)
B. Leriche, CNRS, IAS, Univ. Paris Sud-11 (France)
B. Bélier, CNRS, IEF, Univ. Paris Sud-11 (France)
L. Dumoulin, CNRS, CSNSM, Univ. Paris Sud-11 (France)
L. Bergé, CNRS, CSNSM, Univ. Paris Sud-11 (France)
M. Piat, CNRS, APC, Univ. Paris 7 Denis Diderot (France)
E. Bréelle, CNRS, APC, Univ. Paris 7 Denis Diderot (France)
D. Prêle, CNRS, APC, Univ. Paris 7 Denis Diderot (France)
F. Voisin, CNRS, APC, Univ. Paris 7 Denis Diderot (France)


Published in SPIE Proceedings Vol. 7020:
Millimeter and Submillimeter Detectors and Instrumentation for Astronomy IV
William D. Duncan; Wayne S. Holland; Stafford Withington; Jonas Zmuidzinas, Editor(s)

© SPIE. Terms of Use
Back to Top