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Proceedings Paper

Picometer accuracy white light fringe modeling for SIM PlanetQuest spectral calibration development unit
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Paper Abstract

The SIM PlanetQuest Mission will perform astrometry to one microarcsecond accuracy using optical interferometers requiring optical path delay difference (OPD) measurements accurate to tens of picometers. Success relies on very precise calibration. Spectral Calibration Development Unit (SCDU) has been built to demonstrate the capability of calibrating spectral dependency of the white light fringe OPD to accuracy better than 20pm. In this article, we present the spectral calibration modeling work for SCDU to achieve the SIM PlanetQuest Engineering Milestone 4. SCDU data analysis shows that the wave front aberrations cause the instrument phase dispersions to vary by tens of nanometers over the bandwidth of a CCD pixel making the previous model inadequate. We include the effect of the wave front aberrations in the white light fringe model and develop a procedure for calibrating the corresponding model parameters using long stroke fringe data based on Discrete Fourier Transform. We make the calibration procedure flight traceable by dividing the whole calibration into the instrument calibration and the source spectral calibration. End-to-end simulations are used to quantify both the systematic and random errors in spectral calibration. The efficacy of the calibration scheme is demonstrated using the SCDU experimental data.

Paper Details

Date Published: 28 July 2008
PDF: 12 pages
Proc. SPIE 7013, Optical and Infrared Interferometry, 70134Z (28 July 2008); doi: 10.1117/12.790294
Show Author Affiliations
C. Zhai, Jet Propulsion Lab. (United States)
J. Yu, Jet Propulsion Lab. (United States)
M. Shao, Jet Propulsion Lab. (United States)
R. Goullioud, Jet Propulsion Lab. (United States)
X. An, Jet Propulsion Lab. (United States)
R. Demers, Jet Propulsion Lab. (United States)
M. Milman, Jet Propulsion Lab. (United States)
T. Shen, Jet Propulsion Lab. (United States)
H. Tang, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 7013:
Optical and Infrared Interferometry
Markus Schöller; William C. Danchi; Françoise Delplancke, Editor(s)

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