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Proceedings Paper

Some considerations for precision metrology of thin x-ray mirrors
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Paper Abstract

Determination of the shape of very thin x-ray mirrors employed in spaced-based telescopes continues to be challenging. The mirrors' shapes are not readily deduced to the required accuracy because the mount induced distortions are often larger than the uncertainty tolerable for the mission metrology. In addition to static deformations, dynamic and thermal considerations are exacerbated for this class of mirrors. We report on the performance of one temporary mounting scheme for the thin glass mirrors for the Constellation-X mission and prospects for deducing their undistorted shapes.

Paper Details

Date Published: 25 July 2008
PDF: 8 pages
Proc. SPIE 7018, Advanced Optical and Mechanical Technologies in Telescopes and Instrumentation, 701815 (25 July 2008); doi: 10.1117/12.789798
Show Author Affiliations
J. P. Lehan, Ctr. for Research and Exploration in Space Science and Technology, NASA Goddard Space Flight Ctr. (United States)
Univ. of Maryland, Baltimore County (United States)
T. Saha, NASA Goddard Space Flight Ctr. (United States)
W. W. Zhang, NASA Goddard Space Flight Ctr. (United States)
S. Owens Rohrbach, NASA Goddard Space Flight Ctr. (United States)
K.-W. Chan, Ctr. for Research and Exploration in Space Science and Technology, NASA Goddard Space Flight Ctr. (United States)
Univ. of Maryland, Baltimore County (United States)
T. Hadjimichael, Nasa Goddard Space Flight Ctr. (United States)
Ball Aerospace (United States)
M. Hong, NASA Goddard Space Flight Ctr. (United States)
SGT, Inc. (United States)
W. Davis, Harvard-Smithsonian Ctr. for Astrophysics (United States)


Published in SPIE Proceedings Vol. 7018:
Advanced Optical and Mechanical Technologies in Telescopes and Instrumentation
Eli Atad-Ettedgui; Dietrich Lemke, Editor(s)

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