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Proceedings Paper

Physics of reverse annealing in high-resistivity Chandra ACIS CCDs
Author(s): C. E. Grant; B. LaMarr; G. Y. Prigozhin; S. E. Kissel; S. K. Brown; M. W. Bautz
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Paper Abstract

After launch, the Advanced CCD Imaging Spectrometer (ACIS), a focal plane instrument on the Chandra Xray Observatory, suffered radiation damage from exposure to soft protons during passages through the Earth's radiation belts. An effect of the damage was to increase the charge transfer inefficiency (CTI) of the front illuminated CCDs. As part of the initial damage assessment, the focal plane was warmed from the operating temperature of -100° C to +30° C which unexpectedly further increased the CTI. We report results of ACIS CCD irradiation experiments in the lab aimed at better understanding this reverse annealing process. Six CCDs were irradiated cold by protons ranging in energy from 100 keV to 400 keV, and then subjected to simulated bakeouts in one of three annealing cycles. We present results of these lab experiments, compare them to our previous experiences on the ground and in flight, and derive limits on the annealing time constants.

Paper Details

Date Published: 24 July 2008
PDF: 9 pages
Proc. SPIE 7021, High Energy, Optical, and Infrared Detectors for Astronomy III, 702119 (24 July 2008); doi: 10.1117/12.789750
Show Author Affiliations
C. E. Grant, Massachusetts Institute of Technology (United States)
B. LaMarr, Massachusetts Institute of Technology (United States)
G. Y. Prigozhin, Massachusetts Institute of Technology (United States)
S. E. Kissel, Massachusetts Institute of Technology (United States)
S. K. Brown, NASA Goddard Space Flight Ctr. (United States)
M. W. Bautz, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 7021:
High Energy, Optical, and Infrared Detectors for Astronomy III
David A. Dorn; Andrew D. Holland, Editor(s)

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