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Proceedings Paper

Pico meter metrology for the GAIA mission
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Paper Abstract

To measure the relative motions of GAIA's telescopes, the angle between the telescopes is monitored by an all Silicon Carbide Basic Angle Monitoring subsystem (BAM OMA). TNO is developing this metrology system. The stability requirements for this metrology system go into the pico meter and pico radian range. Such accuracies require extreme measures and extreme stability. Specific topics addressed are mountings of opto-mechanical components, gravity deformation, materials and tests that were necessary to prove that the requirements are feasible. Especially mounting glass components on Silicon Carbide and mastering the Silicon Carbide material proved to be a challenge.

Paper Details

Date Published: 12 July 2008
PDF: 10 pages
Proc. SPIE 7010, Space Telescopes and Instrumentation 2008: Optical, Infrared, and Millimeter, 70102O (12 July 2008); doi: 10.1117/12.789339
Show Author Affiliations
E. A. Meijer, TNO Science and Industry (Netherlands)
J. N. Nijenhuis, TNO Science and Industry (Netherlands)
R. J. P. Vink, TNO Science and Industry (Netherlands)
F. Kamphues, TNO Science and Industry (Netherlands)

Published in SPIE Proceedings Vol. 7010:
Space Telescopes and Instrumentation 2008: Optical, Infrared, and Millimeter
Jacobus M. Oschmann; Mattheus W. M. de Graauw; Howard A. MacEwen, Editor(s)

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