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Proceedings Paper

Optical constants in the hard x-ray/soft gamma-ray range
Author(s): C. P. Jensen; N. Brejnholdt; S. Romaine; R. Bruni; F. E. Christensen; D. H. Lumb; Z. Zhong
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Paper Abstract

Future astrophysics missions operating in the hard X-ray/Soft Gamma ray range is slated to carry novel focusing telescopes based on the use of depth graded multilayer reflectors. Current design studies show that, at the foreseen focal lengths, it should be feasible to focus X-rays at energies as high as 300 keV. These designs use extrapolations of theoretical and experimentally determined optical constants below 100 keV. We have previously shown that determining the optical constants from traditional single layer film above 40 keV is very difficult. One needs to have substrates which are very flat and it is very important to know the exact flatness. In this paper we report on the experimental determination of optical constants up to and above 130 keV using substrates with sub arcsecond flatness. We present these results as obtained at the National Synchrotron Light Source in Brookhaven and compare these to theoretically calculated values and previous experiments.

Paper Details

Date Published: 15 July 2008
PDF: 9 pages
Proc. SPIE 7011, Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray, 70111K (15 July 2008); doi: 10.1117/12.788983
Show Author Affiliations
C. P. Jensen, National Space Institute, Danmarks Tekniske Univ. (Denmark)
N. Brejnholdt, National Space Institute, Danmarks Tekniske Univ. (Denmark)
S. Romaine, Harvard-Smithsonian Ctr. for Astrophysics (United States)
R. Bruni, Harvard-Smithsonian Ctr. for Astrophysics (United States)
F. E. Christensen, National Space Institute, Danmarks Tekniske Univ. (Denmark)
D. H. Lumb, European Space Agency (Netherlands)
Z. Zhong, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 7011:
Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray
Martin J. L. Turner; Kathryn A. Flanagan, Editor(s)

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