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Proceedings Paper

Characterization of wafer-scale and many-output CCD detectors
Author(s): Michael Lesser; Roy Tucker
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Paper Abstract

The latest CCD detectors destined for advanced astronomical instruments are larger and have more output amplifiers than previous devices. Examples are the Semiconductor Technology Associates, Inc. 16-output STA1600 and STA1900 devices and the 8-output STA2200 Orthogonal Transfer Array CCDs. Back illuminated versions of these devices have been processed and evaluated at the University of Arizona Imaging Technology Laboratory and are the subject of this paper. Characterizing these devices has required new optical testing equipment and optimized techniques to efficiently evaluate device performance. This is especially true when even limited volume production is required. In this paper we discuss the hardware related to characterization of the large format (135 mm diagonal) and 8- and 16- output CCDs at cold temperatures, including quantum efficiency, charge transfer efficiency, noise, full well, cross-talk, and operating parameters. We also discuss related developments in dewar construction and operation, including a hybrid closed cycle and liquid nitrogen cooling system used for long-term testing, the characterization optical system, and related device packaging. We also describe the equipment for wafer level probe testing of the same devices.

Paper Details

Date Published: 22 July 2008
PDF: 11 pages
Proc. SPIE 7021, High Energy, Optical, and Infrared Detectors for Astronomy III, 70211U (22 July 2008); doi: 10.1117/12.788349
Show Author Affiliations
Michael Lesser, Steward Observatory, Univ. of Arizona (United States)
Roy Tucker, Steward Observatory, Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 7021:
High Energy, Optical, and Infrared Detectors for Astronomy III
David A. Dorn; Andrew D. Holland, Editor(s)

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