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Proceedings Paper

Instrumental background of the x-ray CCD camera in space: its dependence on the configuration parameters of CCD
Author(s): Takayasu Anada; Tadayasu Dotani; Masanobu Ozaki; Hiroshi Murakami
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Paper Abstract

We studied how the configuration parameters of a CCD (pixel size and depletion layer thickness) affect the instrumental background of an X-ray CCD camera in the space environment through the Monte-Carlo simulation. X-ray detectors are in general sensitive not only to X-rays but also to charged particles. The latter produce pseudo-signal indistinguishable from that of X-rays, which is called instrumental background. It is essential to reduce the instrumental background for the observations of dim and diffuse X-ray sources, but the low background was not considered as a design goal of an X-ray CCD camera so far. We utilized the Monte-Carlo simulator, which could successfully reproduce the Suzaku XIS background, for the current analysis. We found that thicker depletion layer tends to increase the background except for the >5 keV band of the backside-illuminated CCD. On the other hand, pixel-size dependence was different between the frontside and backside illuminated CCDs. These results are interpreted in terms of the interaction of cosmic/X-rays with the CCD.

Paper Details

Date Published: 15 July 2008
PDF: 10 pages
Proc. SPIE 7011, Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray, 70113X (15 July 2008); doi: 10.1117/12.788138
Show Author Affiliations
Takayasu Anada, Institute of Space and Astronomical Science, Japan Aerospace Exploration Agency (Japan)
Tadayasu Dotani, Institute of Space and Astronomical Science, Japan Aerospace Exploration Agency (Japan)
Masanobu Ozaki, Institute of Space and Astronomical Science, Japan Aerospace Exploration Agency (Japan)
CREST, Japan Science and Technology Agency (Japan)
Hiroshi Murakami, Rikkyo Univ. (Japan)


Published in SPIE Proceedings Vol. 7011:
Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray
Martin J. L. Turner; Kathryn A. Flanagan, Editor(s)

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