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Proceedings Paper

Polarimetry with a soft x-ray spectrometer
Author(s): Herman L. Marshall
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Paper Abstract

An approach for measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics is described. A set of multilayer-coated flats reflect the dispersed X-rays to the instrument detectors. The intensity variation as a function of energy and position angle is measured to determine three Stokes parameters: I, Q, and U. By laterally grading the multilayer optics and matching the dispersion of the gratings, one may take advantage of high multilayer reflectivities and achieve modulation factors over 80% over the entire 0.2 to 0.8 keV band. A sample design is shown that could be used with a small orbiting mission.

Paper Details

Date Published: 15 July 2008
PDF: 8 pages
Proc. SPIE 7011, Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray, 701129 (15 July 2008); doi: 10.1117/12.787249
Show Author Affiliations
Herman L. Marshall, Massachusetts Institute of Technology Kavli Institute (United States)


Published in SPIE Proceedings Vol. 7011:
Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray
Martin J. L. Turner; Kathryn A. Flanagan, Editor(s)

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