Share Email Print
cover

Proceedings Paper

An image reconstruction method by deconvolution for ECT
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Eddy Current Testing(ECT) has been used in wide field such as airline and power plants for maintenance, ironworks for production. However original flaw shape blur in image by signal of ECT. In our previous work an image reconstruction method from signal had been proposed. The method is based on that simple relationship between signal and source are described by a convolution of response function and flaw shape. The method was able to show more fine image of points flaw, short line flaw, long line flaw than images of those original signal. One difficulty in the method was to determine empirical parameter by trial and error. In this paper, we propose a concept of modified response function and signal that enable to make empirical parameter unnecessary. Those modification process is fully programmable and is carried out automatically. Validity of introducing those modification are considered from mathematical view point. Numerical results shows the method with this concept reconstructed image as same as empirical parameter method.

Paper Details

Date Published: 8 April 2008
PDF: 9 pages
Proc. SPIE 6934, Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2008, 69340P (8 April 2008); doi: 10.1117/12.787130
Show Author Affiliations
Akira Sasamoto, National Institute of Advanced Industrial Science and Technology (Japan)
Takayuki Suzuki, National Institute of Advanced Industrial Science and Technology (Japan)
Yoshihiro Nishimura, National Institute of Advanced Industrial Science and Technology (Japan)


Published in SPIE Proceedings Vol. 6934:
Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2008
Peter J. Shull; H. Felix Wu; Aaron A. Diaz; Dietmar W. Vogel, Editor(s)

© SPIE. Terms of Use
Back to Top