Share Email Print

Proceedings Paper

Precision laser system based on complementary scanning principle for dielectric materials microprocessing
Author(s): Nikolay Goloshevsky; Aleksey Aleshin; Sergey Baev; Victor Bessmeltsev; Konstantin Smirnov; Mikhail Maksimov; Mikhail Mikhailov
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

To optimize laser processing of some materials, it is necessary to ensure high-speed displacement of the focused laser beam ~1 m/s with a great power density. A required speed can be attained owing to scanning systems based on galvanometer deflectors, but the writing field of such scanning systems is restricted to a size of less than 1 dm2 for the lasers with λ=1-10 micron. In many laser microprocessing applications a field that must be larger by one order of magnitude required.It is possible to solve such problems using complementary scanners. We developed several devices with use of complementary scanning principle for microprocessing with micron resolution by high power lasers (50-400 W). The developed systems contain the "fast" scanning unit consisting of precision galvanometer scanners and F-Theta lens that, in its turn, can be displaced by "slow" drives over the entire writing field. This paper will describe problems arising in creating the systems based on complementary scanner devices, namely, correct image partitioning into small writing zones, "joining" of writing elements occurred in adjacent zones, and also consideration of geometric distortions in the optical system of the scanning head and its orientation. Furthermore, in order to obtain the maximal writing speed with minimal errors over the entire field, we have to ensure effective four-drive system control. Experimental results of microprocessing of the dielectric specimens, obtained by means of created complementary scanners system, will be pesent.

Paper Details

Date Published: 15 January 2008
PDF: 9 pages
Proc. SPIE 6985, Fundamentals of Laser Assisted Micro- and Nanotechnologies, 69850M (15 January 2008); doi: 10.1117/12.787113
Show Author Affiliations
Nikolay Goloshevsky, Institute of Automation and Electrometry (Russia)
Aleksey Aleshin, Institute of Automation and Electrometry (Russia)
Sergey Baev, Institute of Automation and Electrometry (Russia)
Victor Bessmeltsev, Institute of Automation and Electrometry (Russia)
Konstantin Smirnov, Institute of Automation and Electrometry (Russia)
Mikhail Maksimov, Institute of Automation and Electrometry (Russia)
Mikhail Mikhailov, Institute of Automation and Electrometry (Russia)

Published in SPIE Proceedings Vol. 6985:
Fundamentals of Laser Assisted Micro- and Nanotechnologies
Vadim P. Veiko, Editor(s)

© SPIE. Terms of Use
Back to Top