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Proceedings Paper

Optical properties of the chalcogenide films for interference coatings in IR spectral range
Author(s): Eugeny Nikolaevich Kotlikov; Vadim Nikolaevich Prokashev; Alexey Nikolaevich Tropin
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Paper Abstract

Interference coating for infrared spectral region required the transparent optical films with different refraction indexes and minimal an absorption factor. It is well known, that chalcogenide materials based on sulfide and selenide are the perspective film's forming materials for manufacturing of the interference coating. Among the known materials, the minimal absorption factors have arsenic chalcogenide films. It allows using them for manufacturing of the high quality optics in wide optical region, including optics for CO2 powerful lasers.1 Despite of good operational characteristics and the small optical losses, many of known chalcogenide materials have not received a wide distribution. One of the reasons of that is the absence of the data of their film's optical constants (OC) of these substances, which strongly depend on a way and conditions of manufacturing and are different from OC of initial monocrystals. In this paper the optical constants of the chalcogenide films various composition were described. Investigated films were manufacturing on fused quartz substrates by vacuum deposition. Initial substances As2Se3, AsSe4, AsS4 and AsS16.2Se16.2 were evaporated from molybdenum hull in vacuum 3•10-5 Pa. Refractive index and extinction coefficient dispersion in 0.5-2.5 μm spectral range were determined by method is based on analysis of the interference transmission spectra.

Paper Details

Date Published: 15 January 2008
PDF: 6 pages
Proc. SPIE 6985, Fundamentals of Laser Assisted Micro- and Nanotechnologies, 698506 (15 January 2008); doi: 10.1117/12.786942
Show Author Affiliations
Eugeny Nikolaevich Kotlikov, St. Petersburg State Univ. of Aerospace Instrumentation (Russia)
Vadim Nikolaevich Prokashev, St. Petersburg State Univ. of Aerospace Instrumentation (Russia)
Alexey Nikolaevich Tropin, Scientific-Research Institute, Giricond (Russia)

Published in SPIE Proceedings Vol. 6985:
Fundamentals of Laser Assisted Micro- and Nanotechnologies
Vadim P. Veiko, Editor(s)

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