Share Email Print
cover

Proceedings Paper

A first-generation software product line for data acquisition systems in astronomy
Author(s): J. C. López-Ruiz; Rubén Heradio; José Antonio Cerrada Somolinos; José Ramón Coz Fernandez; Pablo López Ramos
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This article presents a case study on developing a software product line for data acquisition systems in astronomy based on the Exemplar Driven Development methodology and the Exemplar Flexibilization Language tool. The main strategies to build the software product line are based on the domain commonality and variability, the incremental scope and the use of existing artifacts. It consists on a lean methodology with little impact on the organization, suitable for small projects, which reduces product line start-up time. Software Product Lines focuses on creating a family of products instead of individual products. This approach has spectacular benefits on reducing the time to market, maintaining the know-how, reducing the development costs and increasing the quality of new products. The maintenance of the products is also enhanced since all the data acquisition systems share the same product line architecture.

Paper Details

Date Published: 15 July 2008
PDF: 9 pages
Proc. SPIE 7019, Advanced Software and Control for Astronomy II, 70191L (15 July 2008); doi: 10.1117/12.786834
Show Author Affiliations
J. C. López-Ruiz, Instituto de Astrofísica de Canarias (Spain)
Univ. Nacional a Distancia (Spain)
Univ. de La Laguna (Spain)
Rubén Heradio, Univ. Nacional a Distancia (Spain)
José Antonio Cerrada Somolinos, Univ. Nacional a Distancia (Spain)
José Ramón Coz Fernandez, Univ. Nacional a Distancia (Spain)
Pablo López Ramos, Instituto de Astrofísica de Canarias (Spain)


Published in SPIE Proceedings Vol. 7019:
Advanced Software and Control for Astronomy II
Alan Bridger; Nicole M. Radziwill, Editor(s)

© SPIE. Terms of Use
Back to Top