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Proceedings Paper

Application of discrete layer peeling algorithm for design of selective photonic devices obeying the constraints of the fabrication process
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Paper Abstract

Results of the Discrete Layer Peeling (DLP) inverse scattering algorithm do not directly correspond to Bragg grating's technological parameters. We propose a method of transforming a stack of discrete complex reflectors resulting from DLP into physical and geometrical parameters of a Bragg grating suitable for fabrication in planar technology. Particularly, the method keeps lengths of grating sections (teeth and grooves) above a required technological minimum. While the stack of complex reflectors is a natural output DLP, it can also be computed from a space distribution of the complex coupling coefficient determined in other ways.

Paper Details

Date Published: 1 May 2008
PDF: 9 pages
Proc. SPIE 6996, Silicon Photonics and Photonic Integrated Circuits, 69961P (1 May 2008); doi: 10.1117/12.785812
Show Author Affiliations
Marcin Wielichowski, Wroclaw Univ. of Technology (Poland)
Sergiusz Patela, Wroclaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 6996:
Silicon Photonics and Photonic Integrated Circuits
Giancarlo C. Righini; Seppo K. Honkanen; Lorenzo Pavesi; Laurent Vivien, Editor(s)

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