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Proceedings Paper

Magnetotunable backward waves in multilayered metamaterials at quantum Hall effect conditions
Author(s): Roland H. Tarkhanyan; Dimitris G. Niarchos
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Paper Abstract

The focus of this report is the peculiarities of electromagnetic wave propagation in magnetic metamaterials with a periodic array of two-dimensional (2D) electronic gas layers. A model system is considered which consists of alternating layers of a magnetic insulator and nanoscale metallic layers or GaAs-AlGaAs-type semiconductor bilayers with 2D electronic plasma. In the presence of a strong external magnetic field perpendicular to the plane of the layers, the Landau quantization of the electron motion and confinement of the electrons within 2D layers lead to the realization of the integer quantum Hall effect. Assuming that a unit cell dimension of the structure is much smaller than the wavelength of interest and using expressions for the effective permittivity and permeability tensors of the system, the dispersion relations and behavior of refracted electromagnetic waves are studied at an arbitrary angle of incidence with respect to the magnetic field. It is shown that when the wave is incident on the top surface of the structure, the negative refraction is impossible. Despite of that, the medium exhibits a propagation of a backward wave with wavefront normal directed toward the refracting interface. In addition, the frequency regions of existence for the backward waves can be tuned by applied magnetic field. The effects of the quantization of 2D electron dynamics are examined

Paper Details

Date Published: 6 May 2008
PDF: 8 pages
Proc. SPIE 6987, Metamaterials III, 698725 (6 May 2008); doi: 10.1117/12.785613
Show Author Affiliations
Roland H. Tarkhanyan, National Ctr. for Scientific Research Demokritos (Greece)
Institute of Radiophysics and Electronics (Armenia)
Dimitris G. Niarchos, National Ctr. for Scientific Research Demokritos (Greece)


Published in SPIE Proceedings Vol. 6987:
Metamaterials III
Nigel P. Johnson; Ekmel Özbay; Nikolay I. Zheludev; Richard W. Ziolkowski, Editor(s)

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