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Proceedings Paper

Passive THz imaging system for stand-off identification of concealed objects: results from a turn-key 16 pixel imager
Author(s): A. Luukanen; L. Grönberg; T. Haarnoja; P. Helistö; K. Kataja; M. Leivo; A. Rautiainen; J. Penttilä; J. E Bjarnason; C. R. Dietlein; M. D. Ramirez; E. N. Grossman
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Paper Abstract

Passive imaging of concealed objects at stand-off distances in excess of a few meters requires both excellent spatial, thermal and temporal resolution from the terahertz imaging system. The combination of these requirements while keeping the overall system cost at a reasonable level has been the motivation for this joint work. The THz imaging system under development is capable of sub-Kelvin NETD at video frame rates. In this paper we report the first imaging results from a 16-pixel array of superconducting antenna-coupled NbN vacuum-bridge microbolometers, operated within a cryogen-free, turn-key refrigerator. In addition to the system overview, we shall also address the uniformity of the detectors and present passive indoors raster-scanned imagery.

Paper Details

Date Published: 25 April 2008
PDF: 9 pages
Proc. SPIE 6948, Passive Millimeter-Wave Imaging Technology XI, 69480O (25 April 2008); doi: 10.1117/12.784922
Show Author Affiliations
A. Luukanen, Millimetre Wave Lab. of Finland (Finland)
L. Grönberg, VTT (Finland)
T. Haarnoja, VTT (Finland)
P. Helistö, VTT (Finland)
K. Kataja, VTT (Finland)
M. Leivo, VTT (Finland)
A. Rautiainen, VTT (Finland)
J. Penttilä, Aivon Oy (Finland)
J. E Bjarnason, National Institute of Standards and Technology (United States)
C. R. Dietlein, Univ. of Colorado, Boulder (United States)
National Institute of Standards and Technology (United States)
M. D. Ramirez, Univ. of Colorado, Boulder (United States)
National Institute of Standards and Technology (United States)
E. N. Grossman, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 6948:
Passive Millimeter-Wave Imaging Technology XI
Roger Appleby; David A. Wikner, Editor(s)

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