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Proceedings Paper

Snapshot imaging spectropolarimetry in the visible and infrared
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Paper Abstract

Two imaging systems have been designed and built to function as snapshot imaging spectropolarimeters; one system made to operate in the visible part of the spectrum, the other for the long wavelength infrared, 8 to 12 microns. The devices are based on computed tomographic imaging channeled spectropolarimetry (CTICS), a unique technology that allows both the spectra and the polarization state for all of the wavelength bands in the spectra to be simultaneously recorded from every spatial position in an image with a single integration period of the imaging system. The devices contain no moving parts and require no scanning, allowing them to acquire data without the artifacts normally associated with scanning spectropolarimeters. Details of the two imaging systems will be presented.

Paper Details

Date Published: 31 March 2008
PDF: 9 pages
Proc. SPIE 6972, Polarization: Measurement, Analysis, and Remote Sensing VIII, 69720D (31 March 2008); doi: 10.1117/12.784793
Show Author Affiliations
Riley W. Aumiller, College of Optical Sciences, The Univ. of Arizona (United States)
Corrie Vanderlugt, College of Optical Sciences, The Univ. of Arizona (United States)
Eustace L. Dereniak, College of Optical Sciences, The Univ. of Arizona (United States)
Robert Sampson, I Technology Applications (United States)
Robert W. McMillan, U.S. Army Space and Missile Defense Command (United States)


Published in SPIE Proceedings Vol. 6972:
Polarization: Measurement, Analysis, and Remote Sensing VIII
David B. Chenault; Dennis H. Goldstein, Editor(s)

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