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Proceedings Paper

Recognition of defect structure of Si(A4) by on-line support vector machine
Author(s): Tomasz Dziedzic; Janusz Będkowski; Stanisław Jankowski
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Paper Abstract

In this paper the application of on-line support vector machine to spectral surface approximation is presented. The experimental data were obtained by the photocurrent decay measurement as function of time and temperature for a sample of neutron irradiated silicon. This approach enabled to extract the deep level center defect parameters: activation energy and pre-exponential factor.

Paper Details

Date Published: 28 December 2007
PDF: 5 pages
Proc. SPIE 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 69371W (28 December 2007); doi: 10.1117/12.784709
Show Author Affiliations
Tomasz Dziedzic, Warsaw Univ. of Technology (Poland)
Janusz Będkowski, Warsaw Univ. of Technology (Poland)
Stanisław Jankowski, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 6937:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007

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