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Proceedings Paper

Application of local cluster neural network to detect structure analysis of semi-insulating GaAs
Author(s): Stanisław Jankowski; Tomasz Piotr Pichlak
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Paper Abstract

This paper prsents a method of detection of deep defect centres in semi-insulating materials, with usage of neural net application. Innovation of this work is based on implementation of local cluster activation function in standard scheme of neural network.

Paper Details

Date Published: 28 December 2007
PDF: 7 pages
Proc. SPIE 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 69371V (28 December 2007); doi: 10.1117/12.784708
Show Author Affiliations
Stanisław Jankowski, Warsaw Univ. of Technolgy (Poland)
Tomasz Piotr Pichlak, Warsaw Univ. of Technolgy (Poland)


Published in SPIE Proceedings Vol. 6937:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007

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