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Proceedings Paper

Hybrid infrared scene projector (HIRSP): a high dynamic range infrared scene projector, part II
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Paper Abstract

This paper is a continuation of the merging of two dynamic infrared scene projector technologies to provide a unique and innovative solution for the simulation of high dynamic temperature ranges for testing infrared imaging sensors. This paper will present some of the challenges and performance issues encountered in implementing this unique projector system into a Hardware-in-the-Loop (HWIL) simulation facility. The projection system combines the technologies of a Honeywell BRITE II extended voltage range emissive resistor array device and an optically scanned laser diode array projector (LDAP). The high apparent temperature simulations are produced from the luminescent infrared radiation emitted by the high power laser diodes. The hybrid infrared projector system is being integrated into an existing HWIL simulation facility and is used to provide real-world high radiance imagery to an imaging infrared unit under test. The performance and operation of the projector is presented demonstrating the merit and success of the hybrid approach. The high dynamic range capability simulates a 250 Kelvin apparent background temperature to 850 Kelvin maximum apparent temperature signatures. This is a large increase in radiance projection over current infrared scene projection capabilities.

Paper Details

Date Published: 11 April 2008
PDF: 12 pages
Proc. SPIE 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII, 69420J (11 April 2008); doi: 10.1117/12.784100
Show Author Affiliations
Thomas M. Cantey, Optical Sciences Corp. (United States)
Mark Bowden, Optical Sciences Corp. (United States)
David Cosby, U.S. Army Aviation and Missile Research, Development and Engineering Ctr. (United States)
Gary Ballard, U.S. Army Aviation and Missile Research, Development and Engineering Ctr. (United States)


Published in SPIE Proceedings Vol. 6942:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII
Robert Lee Murrer, Editor(s)

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