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Proceedings Paper

Online extrinsic parameter calibration of stereo vision coordinate measurement system
Author(s): Qiaoyu Xu; Dong Ye; Rensheng Che; Qiangguo Fan
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Paper Abstract

To carry out precise measurement of large-scale complex workpieces, accurately calibration of stereo vision coordinate system becomes more and more important. This paper presents a flexible and valid method for calibrating stereo vision coordinate system, which overcomes the complexity and difficulty of traditional calibration methods. By moving the optical reference bar over the measurement volume with known length for three horizontal infrared LEDs and three vertical infrared LEDs as feature points, the relative orientation and position of two cameras can be quickly determined with epipolar constraint of the stereo cameras catching features through linear algorithm and LM iteration method. The scale factor of the translation between two cameras can be calculated by the distance between two extremity feature points of the optical reference bar. By automatically controlling the light intensity and optimizing the exposure time, the feature points can get uniform intensity and obtain higher S/N ratio at different distance, so the calibration accuracy is improved. Experiment result proves that the calibration method proposed is flexible, valid, and can obtain high calibration accuracy and good results in the application.

Paper Details

Date Published: 17 January 2008
PDF: 8 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672360 (17 January 2008); doi: 10.1117/12.783844
Show Author Affiliations
Qiaoyu Xu, Harbin Institute of Technology (China)
Dong Ye, Harbin Institute of Technology (China)
Rensheng Che, Harbin Institute of Technology (China)
Qiangguo Fan, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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