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Proceedings Paper

Data preprocessing of the exterior field of vision assembling photogrammetric camera
Author(s): Jinguo Liu; Jie Li; Guangze Li; Zhe Wang
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Paper Abstract

Transmit array photogrammetric camera can obtain image which is high geometric fidelity and high photogrammetric quality. However, the single chip array CCD image sensor camera can't meet the need of measuring precision and photogrammetric covering area. In order to obtain large numbers of information and extensive photogrammetric covering area, we must increase field of vision angle and improve photogrammetric covering area. And all these objects can be realized by exterior field of vision assembling photogrammetric camera. Two side work must be done before images, which obtained by exterior field of vision assembling photogrammetric camera, be used in photogrammetry. First, all assembling camera focal plane need be converted to a benchmark coordinate focal plane to realize camera digital assembling. Second, images must be re-sampled and processing. Because of coordinate conversion, two images from different assembling cameras can be established function relation, which a pixel of image from a camera is corresponding to a pixel of another image from different camera. But through this conversion, some pixels maybe extrusion together and other pixels separate on an image area. So interpolation direction finding(IDF) is used to obtain these pixels and realize image re-sampling. In this paper, the structure of exterior field of vision assembling photogrammetric camera is analyzed, and the coordinate conversion method of exterior field of vision assembling photogrammetric camera and image gray re-sampling method also can be discussed. All the works are based to data pretreatment of exterior vision assembling photogrammetric camera.

Paper Details

Date Published: 17 January 2008
PDF: 5 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67235E (17 January 2008); doi: 10.1117/12.783773
Show Author Affiliations
Jinguo Liu, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Jie Li, Changchun Univ. (China)
Guangze Li, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Zhe Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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