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Proceedings Paper

Narcissus analysis for cooled staring IR system
Author(s): Feng-Yun He; Ji-Cheng Cui; Shu-Long Feng; Xin Zhang
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Paper Abstract

Narcissus can have a deleterious effect on image quality for cooled infrared imaging systems. Therefore, analysis of narcissus is important for designing both scanning and staring optics. Narcissus is generally assumed to be negligible in staring IR optical designs because the shading effects can be removed by calibration of the detector array data. However, the calibration usually decreases sensitiveness of the system and Narcissus variation may be noticeable for sensors when the conditions changes as follows: 1. warming and cooling the optical housing, 2. zooming optical elements, 3. movement of lenses for focus. In that case, it will result in shading and other image defects even after calibration. To minimize these effects, narcissus should be assessed and controlled during the design of staring array IR system. We provided a direct and fast method for analyzing the narcissus variation in the presence of software such as LightTools, TracePro and ASAP, and proposed the principles in optical design of staring IR systems to reduce narcissus. A cooled staring IR system with serious narcissus was estimated and reoptimized. Narcissus analysis of this IR system confirmed the efficiency of the analysis method.

Paper Details

Date Published: 29 November 2007
PDF: 7 pages
Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 67224N (29 November 2007); doi: 10.1117/12.783729
Show Author Affiliations
Feng-Yun He, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Ji-Cheng Cui, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Shu-Long Feng, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Xin Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 6722:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

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