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Proceedings Paper

Fast image processing on chain board of inverted tooth chain
Author(s): Qing-min Liu; Guo-fa Li
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Paper Abstract

Discussed ordinary image processing technology of inverted tooth chain board, including noise reduction, image segmentation, edge detection and contour extraction etc.. Put forward a new kind of sub-pixel arithmetic for edge orientation of circle. The arithmetic first did edge detection to image by Canny arithmetic, so as to enhance primary orientation precision of edge, then calculated gradient direction, and then interpolated gradient image (image that was detected by Sobel arithmetic) along gradient direction, last obtained sub-pixel orientation of edge. Performed two kinds of least-square fitting methods for line edge to getting its sub-pixel orientation, from analysis and experiments, the orientation error of improved least-square linear fitting method was one quarter of ordinary least-square linear fitting error under small difference of orientation time. The sub-pixel orientation of circle made resolution of CCD increase 42 tines, which enhanced greatly orientation precision of image edge. For the need of quick on-line inspection next step, integrated the whole environment containing image preprocess, Hough conversion of line, setting orientation & direction of image, sub-pixel orientation of line and circle, output of calculation result. The whole quick processing course performed without operator, processing tine of single part is less than 0.3 second. The sub-pixel orientation method this paper posed fits precision orientation of image, and integration calculation method ensure requirement of quick inspection, and lays the foundations for on-line precision visual measurement of image.

Paper Details

Date Published: 27 November 2007
PDF: 8 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67234W (27 November 2007); doi: 10.1117/12.783687
Show Author Affiliations
Qing-min Liu, Hangzhou Dianzi Univ. (China)
Guo-fa Li, Jilin Univ. (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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