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Proceedings Paper

Zernike polynomials for evaluation of optical system in use
Author(s): Baozhong Shan; Baoping Guo; Hanben Niu; Shuyan Wang
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Paper Abstract

Affected by working condition, performance of optical system will decline, especially for large system or system in bad and complex condition. Integrated analysis can predict its performance through multi-subject engineering analysis. Thermal\structural\optical(TSO) integrated analysis is typical[1]. The key problem in TSO process is data transmission among optical, mechanical and thermal programs. Each item of Zernike polynomials has corresponding meanings with Seidel aberrations and is widely used in project, optical design software and interference checks. It is convenient and mature to use Zernike polynomials as data transmission tool between optical and structural analysis program. In TSO process, the principle, fitting method and fitting process of Zernike polynomials are outlined. This method was successfully used in some optical system's design and fabricates process.

Paper Details

Date Published: 27 November 2007
PDF: 7 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67234T (27 November 2007); doi: 10.1117/12.783678
Show Author Affiliations
Baozhong Shan, Shenzhen Univ. (China)
Baoping Guo, Shenzhen Univ. (China)
Hanben Niu, Shenzhen Univ. (China)
Shuyan Wang, Shenzhen Univ. (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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