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Proceedings Paper

Research on the affect of differential-images technique to the resolution of infrared spatial camera
Author(s): Guang Jin; Yuan An; Yingchun Qi; Fusheng Hu
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Paper Abstract

The optical system of infrared spatial camera adopts bigger relative aperture and bigger pixel size on focal plane element. These make the system have bulky volume and low resolution. The potential of the optical systems can not be exerted adequately. So, one method for improving resolution of infrared spatial camera based on multi-frame difference-images is introduced in the dissertation. The method uses more than one detectors to acquire several difference images, and then reconstructs a new high-resolution image from these images through the relationship of pixel grey value. The technique of difference-images that uses more than two detectors is researched, and it can improve the resolution 2.5 times in theory. The relationship of pixel grey value between low-resolution difference-images and high-resolution image is found by analyzing the energy of CCD sampling, a general relationship between the enhanced times of the resolution of the detected figure with differential method and the least count of CCD that will be used to detect figure is given. Based on the research of theory, the implementation process of utilizing difference-images technique to improve the resolution of the figure was simulated used Matlab software by taking a personality image as the object, and the software can output the result as an image. The result gotten from the works we have finished proves that the technique is available in high-resolution image reconstruction. The resolution of infrared spatial camera can be improved evidently when holding the size of optical structure or using big size detector by applying for difference image technique. So the technique has a high value in optical remote fields.

Paper Details

Date Published: 27 November 2007
PDF: 6 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67234O (27 November 2007); doi: 10.1117/12.783654
Show Author Affiliations
Guang Jin, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Yuan An, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yingchun Qi, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Fusheng Hu, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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