Share Email Print
cover

Proceedings Paper

Study on high speed dual-frequency laser interferometry in two longitudinal modes
Author(s): Tao Zhang; Chunsheng Yang; Wanfu Dong; Bin Wu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The frequencies of measuring signal and reference signal output from dual-frequency laser interferometer based on frequency-stabilized double longitudinal modes with thermoregulation are too high to count directly. The signal with right frequency generated by oscillator featuring high frequency stability is used to mix them respectively to get transformed signals with low frequency which can be counted. A fully alternating current system with high measuring speed is gained. This paper presents a schematic diagram of the optical system, a signal processing system of the measuring system and the basic formula for the selection of frequency of the oscillator. The mode interval of developed system is 728MHz, the used counter is 82c54, its top counting frequency is 10 MHz, the frequency of oscillator is determined for 723MHz. Experiment results from a 3m laser length measuring machine with measuring speed better than 1300mm/s, resolution 0.32 μm demonstrated that the system can effectively meet the requirements of high speed measurement and calibration.

Paper Details

Date Published: 27 November 2007
PDF: 5 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67234J (27 November 2007); doi: 10.1117/12.783645
Show Author Affiliations
Tao Zhang, Sichuan Univ. (China)
Chunsheng Yang, Sichuan Univ. (China)
Wanfu Dong, Chengdu Univ. (China)
Bin Wu, Chengdu Univ. (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

© SPIE. Terms of Use
Back to Top