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Proceedings Paper

High bright blue organic light-emitting diodes based on a novel silole derivative
Author(s): Qing Li; Junsheng Yu; Lu Li; Yadong Jiang; Shuangling Lou; Xiaowei Zhan
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Paper Abstract

A high performance blue organci light-emitting diode (OLED) using a silole derivative as emitter has been fabricated by vacuum thermal evaporation method. The triple-layer device structure is indium tin oxide (ITO)/N, N'-diphenyl-N,N'-bis (3-methylphenyl)-1,1'-biphenyl-4,4'-diamine (NPB) (50 nm)/1,2-bis(1-methyl-2,3,4,5-tetra-phenyl-1H-Silole-1-yl)ethane (BMPSiE) (40 nm)/tris (8-hydroxyquinolinolato) aluminum (Alq3) (10 nm)/Mg : Ag(100 nm 10:1), where BMPSiE was employed as an emitting layer (EML), NPB and Alq3 act as hole transporting layer (HTL) and electron transporting layer (ETL), respectively. Experimental results demonstrate that the device consisting of novel emissive material has a maximum luminance of 13500 cd/m2 and a current density of 1520 mA/cm2 at a bias voltage of 20 V.The peak of electroluminescent spectrum locates at 483 nm which well accord with the photoluminescence results. The Commissions International de l'Eclairage (CIE) coordinates locate at (0.20, 0.33), which are independent of the variation of forward bias.

Paper Details

Date Published: 14 November 2007
PDF: 5 pages
Proc. SPIE 6722, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 672244 (14 November 2007); doi: 10.1117/12.783643
Show Author Affiliations
Qing Li, Univ. of Electronic Science and Technology of China (China)
Junsheng Yu, Univ. of Electronic Science and Technology of China (China)
Lu Li, Univ. of Electronic Science and Technology of China (China)
Yadong Jiang, Univ. of Electronic Science and Technology of China (China)
Shuangling Lou, Univ. of Electronic Science and Technology of China (China)
Xiaowei Zhan, Institute of Chemistry (China)


Published in SPIE Proceedings Vol. 6722:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

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