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Proceedings Paper

Application of semiconductor laser on big dimension measuring system
Author(s): Hongtao Zhang; Xuhua Zhai; Xun Zhou; Yanxiu Bi; Gang Di; Xu Han
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Paper Abstract

The structure and principles of an optical non-contact measuring system of large-dimension diameter were analyzed in detail in the paper. This system can be used to measure up to the diameter of 2200 millimeters. And it also can be used to measure the coaxiality of inner and outside of cirque. Moreover, the system can realize measurement of on-line parameters in processing. The ultimate errors in measuring large-dimension diameter are less than 0.02 millimeters.

Paper Details

Date Published: 17 January 2008
PDF: 6 pages
Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67234G (17 January 2008); doi: 10.1117/12.783637
Show Author Affiliations
Hongtao Zhang, Armor Technique Institute of PLA (China)
Xuhua Zhai, Armor Technique Institute of PLA (China)
Xun Zhou, Armor Technique Institute of PLA (China)
Yanxiu Bi, Society Development Servicing Ctr. of Jilin Province (China)
Gang Di, Armor Technique Institute of PLA (China)
Xu Han, Armor Technique Institute of PLA (China)


Published in SPIE Proceedings Vol. 6723:
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Junhua Pan; James C. Wyant; Hexin Wang, Editor(s)

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